High-Speed Time-Domain Measurements—Practical Tips for Improvement

Enhancing the Performance of Pedometers Using a Single Accelerometer

Ask The Application Engineer—36: Wideband A/D Converter Front-End Design Considerations II: Amplifier-or Transformer Drive for the ADC?

High-Performance Multichannel Power-Line Monitoring with Simultaneous-Sampling ADCs

High-Speed DAC Controls Power Amplifier Ramp Profile

Reducing Ground Bounce in DC-to-DC Converters—Some Grounding Essentials

Amplifier Input Protection... Friend or Foe?

Motionless Bandwidth Test for MEMS Sensors

Highly Integrated, Programmable Single-Component Sensors for Industrial System Design

Toward More-Compact Digital Microphones

Data and Power Isolation in One Package Provides Total Isolation Solution

Boost Precision and Accuracy with Single Chip Capacitance- and Impedance-to-Digital Converters

Single-Chip Clock Generator with 14-Channel Distribution Solves Timing Challenges in Networks

If All Else Fails, Read This Article. Avoid Common Problems When Designing Amplifier Circuits

三轴加速度传感器在跌倒检测中的应用

Providing an Edge in Capacitive Sensor Applications

IC provides temperature, bias, and gain in single-supply applications

DC-to-DC Switching-Regulator Insights—Achieving Longer Battery Life in DSP Systems

ESD Diode Doubles as Temperature Sensor

Broadband I/Q Modulator Eases Radio Design

Ask The Applications Engineer—38: Better, Faster Open-Loop Gain Measurement

Data Converter Function Can Help Solve Cost and Size Design Challenges in 3G and 4G Wireless Infrastructure

Solving Dynamic Range Problems in Analog Systems